Yongquan Fan's Accelerating Test, Validation and Debug of High Speed Serial PDF

By Yongquan Fan

ISBN-10: 9048193974

ISBN-13: 9789048193974

High-Speed Serial Interface (HSSI) units became frequent in communications, from the embedded to high-performance computing platforms, and from on-chip to a large haul. trying out of HSSIs has been a difficult subject as a result of sign integrity matters, lengthy attempt time and the necessity of costly tools. Accelerating try, Validation and Debug of excessive velocity Serial Interfaces presents leading edge try out and debug techniques and distinctive directions on easy methods to arrive to useful try of recent high-speed interfaces.

Accelerating attempt, Validation and Debug of excessive pace Serial Interfaces first proposes a brand new set of rules that permits us to accomplish receiver attempt greater than a thousand occasions speedier. Then an under-sampling dependent transmitter try out scheme is gifted. The scheme can thoroughly extract the transmitter jitter and end the full transmitter attempt inside 100ms, whereas the try out often takes seconds. The e-book additionally provides and exterior loopback-based trying out scheme, the place and FPGA-based BER tester and a unique jitter injection method are proposed. those schemes will be utilized to validate, try out and debug HSSIs with facts fee as much as 12.5Gbps at a reduce try expense than natural ATE options. additionally, the ebook introduces an efficieng scheme to enforce excessive functionality Gaussian noise turbines, appropriate for comparing BER functionality less than noise conditions.

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Extra resources for Accelerating Test, Validation and Debug of High Speed Serial Interfaces

Sample text

VCO Judgments in BBPD PLL State A T B Judgment 0 0 0 0 Hold 1 0 0 1 Early 2 0 1 0 Hold 3 0 1 1 Late 4 1 0 0 Late 5 1 0 1 Hold 6 1 1 0 Early 7 1 1 1 Hold Although the sampling mechanism and early/late judgment seem to be simple, it is challenging to design well a BBPD and analyze it accurately due to its nonlinear nature. There are few modeling approaches that have been proposed in literature to facilitate the design and analysis of the BBPD [73], [145], [147]. Figure 3-6 shows the linearized first-order model of a BBPD PLL presented in [73] that we use here as a reference model.

Figure 2-11 illustrates the relationship between jitter and BER. Ideally, the data is always sampled in the mid-bit, sampling instance ts = UI/2 in Figure 2-11(a), where UI is the Unit Interval (period) of the signal. This is usually true if the jitter frequency is within the bandwidth of the CDR because the sampling clock is recovered from the data signal and the clock can track the inband jitter. However, for out-of-band jitter, the sampling clock cannot track the data any more and the jitter can cause bit errors.

This approach can qualify the jitter tolerance performance of HSSIs with data rates up to 3Gbps. 5Gbps. 3 Proposed ew Method To address the two outstanding issues in jitter tolerance testing, we aim to develop schemes that can perform jitter tolerance testing on ATE in a much faster manner. ATE is well known for its high throughput in production. ATE-based solutions are also more widely being used in validation and characterization, especially for performance analysis across process, voltage and temperature corners on a large sample size.

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Accelerating Test, Validation and Debug of High Speed Serial Interfaces by Yongquan Fan


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